DESIGN OF A HIGH-RESOLUTION ELECTRON DIFFRACTION CAMERA

被引:20
作者
COWLEY, JM
REES, ALG
机构
来源
JOURNAL OF SCIENTIFIC INSTRUMENTS | 1953年 / 30卷 / 02期
关键词
D O I
10.1088/0950-7671/30/2/301
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:33 / 38
页数:6
相关论文
共 17 条
[1]   THE MORPHOLOGY OF ZINC OXIDE SMOKE PARTICLES [J].
COWLEY, JM ;
REES, ALG ;
SPINK, JA .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (380) :638-644
[2]   SECONDARY ELASTIC SCATTERING IN ELECTRON DIFFRACTION [J].
COWLEY, JM ;
REES, ALG ;
SPINK, JA .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1951, 64 (379) :609-619
[3]   REFRACTION EFFECTS IN ELECTRON DIFFRACTION [J].
COWLEY, JM ;
REES, ALG .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1947, 59 (332) :287-&
[4]   REFRACTION EFFECTS IN ELECTRON DIFFRACTION [J].
COWLEY, JM ;
REES, ALG .
NATURE, 1946, 158 (4016) :550-551
[5]   SINGLE CRYSTAL ELECTRON DIFFRACTION BY MICRO-CRYSTALLINE MATERIALS [J].
DAVIDSON, N ;
HILLIER, J .
JOURNAL OF APPLIED PHYSICS, 1947, 18 (06) :499-511
[6]  
FINCH GI, 1937, ERG EXAKT NATURWISS, V16, P353
[7]   ON THE IMPROVEMENT OF RESOLUTION IN ELECTRON DIFFRACTION CAMERAS [J].
HILLIER, J ;
BAKER, RF .
JOURNAL OF APPLIED PHYSICS, 1946, 17 (01) :12-22
[8]   THE ILLUMINATING SYSTEM OF THE ELECTRON MICROSCOPE [J].
HILLIER, J ;
ELLIS, SG .
JOURNAL OF APPLIED PHYSICS, 1949, 20 (07) :700-706
[9]   ANOMALIES IN ELECTRON-DIFFRACTION DEBYE-SCHERRER RING [J].
HONJO, G .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1947, 2 (02) :133-137
[10]   OPERATIONAL FEATURES OF A NEW ELECTRON DIFFRACTION UNIT [J].
PICARD, RG ;
SMITH, PC ;
REISNER, JH .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (08) :601-611