NOISE SPIKES IN DIGITAL VLSI CIRCUITS

被引：5
作者：
WALLMARK, JT
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1982年 / 29卷 / 03期
关键词：
D O I：
10.1109/T-ED.1982.20722
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：451 / 458
页数：8
相关论文
共 50 条
  • [31] Noise suppression in VLSI circuits using dummy metal fill
    Gaskill, Steven
    Shilimkar, Vikas
    Weisshaar, Andreas
    [J]. 2008 IEEE WORKSHOP ON SIGNAL PROPAGATION ON INTERCONNECTS, 2008, : 249 - 252
  • [32] Capacitive coupling noise in high-speed VLSI circuits
    Heydari, P
    Pedram, M
    [J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2005, 24 (03) : 478 - 488
  • [33] NOISE MARGINS IN DIGITAL INTEGRATED CIRCUITS
    LUECKE, G
    [J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1565 - &
  • [34] NOISE IN DIGITAL DYNAMIC CMOS CIRCUITS
    LARSSON, P
    SVENSSON, C
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1994, 29 (06) : 655 - 662
  • [35] SIMULATION OF VLSI PROCESSING DEFICIENCIES IN DIGITAL INTEGRATED-CIRCUITS
    NOORE, A
    [J]. MATHEMATICAL AND COMPUTER MODELLING, 1990, 14 : 354 - 358
  • [36] SPURIOUS SIGNALS IN DIGITAL CMOS VLSI CIRCUITS - A PROPAGATION ANALYSIS
    MOLL, F
    RUBIO, A
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 1992, 39 (10): : 749 - 752
  • [37] A DIGITAL DIFFERENTIAL-LINE RECEIVER FOR CMOS VLSI CIRCUITS
    ANGLADA, R
    RUBIO, A
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1991, 38 (06): : 673 - 675
  • [38] Redesignability analysis of digital VLSI circuits with incomplete implementation information
    Wey, CL
    Khalil, MA
    [J]. ISCAS '98 - PROCEEDINGS OF THE 1998 INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-6, 1998, : E147 - E150
  • [39] A Technical Survey on Delay Defects in Nanoscale Digital VLSI Circuits
    Muthukrishnan, Prathiba
    Sathasivam, Sivanantham
    [J]. APPLIED SCIENCES-BASEL, 2022, 12 (18):
  • [40] QUIESCENT CURRENT SENSOR CIRCUITS IN DIGITAL VLSI CMOS TESTING
    RUBIO, A
    FIGUERAS, J
    SEGURA, J
    [J]. ELECTRONICS LETTERS, 1990, 26 (15) : 1204 - 1206
12345