BEO SUPPORTING FILMS FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：5

|

作者：

MIHAMA, K ^{[1
]}

SHIMA, S ^{[1
]}

UYEDA, R ^{[1
]}

机构：

[1] NAGOYA UNIV,FAC ENGN,DEPT APPL PHYS,NAGOYA,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年 / 13卷 / 02期

关键词：

D O I：

10.1143/JJAP.13.377

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：377 / 378

页数：2

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