PHYSICAL PARAMETERS IN HIGH-ACCURACY SPECTROPHOTOMETRY

被引：11

作者：

MIELENZ, KD ^{[1
]}

机构：

[1] NBS, INST BASIC STAND, OPTICAL PHYS DIV, WASHINGTON, DC 20234 USA

来源：

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY | 1972年 / A 76卷 / 05期

关键词：

D O I：

10.6028/jres.076A.040

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：455 / 467

页数：13

共 13 条

[1]

BORN M, 1965, PRINCIPLES OPTICS, pCH1

[2]

BORN M, 1965, PRINCIPLES OPTICS, pCH10

[3]

Born M., 1965, PRINCIPLES OPTICS

[4] HIGH ACCURACY SPECTROPHOTOMETRY AT NATIONAL PHYSICAL LABORATORY [J].

CLARKE, FJJ .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1972, A 76 (05) :375-403

[5] TECHNIQUE FOR MEASURING PHOTOMETRIC ACCURACY [J].

HAWES, RC .

APPLIED OPTICS, 1971, 10 (06) :1246-&

MAVRODINEANU, R .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1972, A 76 (05) :405-425

[7]

MAVRODINEANU R, PRIVATE COMMUNICATIO

[8] SPECTROPHOTOMETER LINEARITY TESTING USING DOUBLE-APERTURE METHOD [J].

MIELENZ, KD ;

ECKERLE, KL .

APPLIED OPTICS, 1972, 11 (10) :2294-&

[9]

MIELENZ KD, TO BE PUBLISHED

[10]

MIELENZ KD, 1972, NBS729 TECH NOT