DEFECT STUDIES IN CRYSTALS BY MEANS OF CHANNELING

被引：314

作者：

BOGH, E

机构：

来源：

CANADIAN JOURNAL OF PHYSICS | 1968年 / 46卷 / 06期

关键词：

D O I：

10.1139/p68-081

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：653 / &

共 20 条

[1]

ANDERSEN JU, 1967, KGL DANSKE VIDEN MFM, V36

[2]

ANDERSEN JU, 1965, NUCL INSTR METH, V38, P207

[3]

BISHAY A, 1966, CAIRO SOLID STATE ED

[4] EXPERIMENTAL INVESTIGATION OF ORIENTATION DEPENDENCE OF RUTHERFORD SCATTERING YIELD IN SINGLE CRYSTALS [J].

BOGH, E ;

UGGERHOJ, E .

NUCLEAR INSTRUMENTS & METHODS, 1965, 38 (DEC) :216-&

[5] REVERSILIBILITY OF FAST-CHARGED-PARTICLE TRAJECTORIES IN SINGLE CRYSTALS [J].

BOGH, E ;

WHITTON, JL .

PHYSICAL REVIEW LETTERS, 1967, 19 (10) :553-&

[6] RUTHERFORD SCATTERING OF PROTONS IN SURFACE LAYERS OF A TUNGSTEN SINGLE CRYSTAL [J].

BOGH, E .

PHYSICAL REVIEW LETTERS, 1967, 19 (02) :61-&

[7]

BOGH E, 1967, INT C SOLID STATE PH

[8]

BOGH E, 1966, CAIRO SOLID STATE

[9] RANGE OF ENERGETIC XE125 IONS IN MONOCRYSTALLINE SILICON [J].

DAVIES, JA ;

BROWN, F ;

BALL, GC ;

DOMEIJ, B .

CANADIAN JOURNAL OF PHYSICS, 1964, 42 (06) :1070-&

[10] CHANNELING OF MEV PROJECTILES IN TUNGSTEN AND SILICON [J].

DAVIES, JA ;

DENHARTOG, J ;

WHITTON, JL .

PHYSICAL REVIEW, 1968, 165 (02) :345-+

← 1 2 →