A versatile field-ion microscope for metallographic studies

被引：13
|
作者：
Davies, D. M. [1 ]
Ralph, B. [1 ]
机构：
[1] Univ Cambridge, Dept Met, Cambridge CB2 1TN, England
来源：
JOURNAL OF MICROSCOPY | 1970年 / 91卷
关键词：
D O I：
10.1111/j.1365-2818.1970.tb02221.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
The design of a simple and robust field-ion microscope for making routine metallurgical investigations is presented. Particular attention is given to the choice of ancillary facilities such as the cooling and image-intensifying systems. Examples of the applications of this microscope are given.
引用
收藏
页码：185 / 195
页数：11
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