ELECTRON BEAM DETECTION OF CHARGE STORAGE IN MOS CAPACITORS

被引：7

作者：

HUBER, EE

COHEN, MS

SMITH, DO

机构：

来源：

关键词：

D O I：

10.1063/1.1653137

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：147 / &

共 7 条

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[2] AN ELECTRON BEAM ACTIVATED SWITCH AND ASSOCIATED MEMORY
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EVERHART, TE
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[3] SELECTIVE ELECTRON-BEAM IRRADIATION OF METAL-OXIDE-SEMICONDUCTOR STRUCTURES
MACDONALD, NC
EVERHART, TE
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2433 - +
[4] IMAGING AND STORAGE WITH A UNIFORM MOS STRUCTURE
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[J]. APPLIED PHYSICS LETTERS, 1967, 11 (11) : 359 - &
[5] INSB MOS INFRARED DETECTOR
PHELAN, RJ
DIMMOCK, JO
[J]. APPLIED PHYSICS LETTERS, 1967, 10 (02) : 55 - &
[6] EFFECTS OF IONIZING RADIATION ON OXIDIZED SILICON SURFACES AND PLANAR DEVICES
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GROVE, AS
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[J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (07): : 1168 - +
[7] ZAININGER KH, 1967, RCA REV, V28, P208