THE RAPID MEASUREMENT OF GENERATION LIFETIME IN MOS CAPACITORS WITH LONG RELAXATION-TIMES

被引：6

|

作者：

KELLER, WW

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1987年 / 34卷 / 05期

关键词：

D O I：

10.1109/T-ED.1987.23056

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1141 / 1146

页数：6

相关论文

共 50 条

[31] DYNAMIC MEASUREMENT OF THERMAL RELAXATION-TIMES OF SUPERCONDUCTING FILMS AT THE TRANSITION-TEMPERATURE
PHAN, HK
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 67 (02): : 371 - 375
[32] MEASUREMENT OF RELAXATION-TIMES BY PHASE-MODULATED ULTRASHORT LIGHT-PULSES
VASILEVA, MA
VISCHAKAS, J
KABELKA, V
MASALOV, AV
OPTICS COMMUNICATIONS, 1985, 53 (06) : 412 - 416
[33] MEASUREMENT OF ORIENTATIONAL RELAXATION-TIMES OF RHODAMINE-6G WITH A STREAK CAMERA
EICHLER, HJ
KLEIN, U
LANGHANS, D
CHEMICAL PHYSICS LETTERS, 1979, 67 (01) : 21 - 23
[34] MEASUREMENT OF THE ELECTROTHERMAL NONLINEARITY AND THERMAL RELAXATION-TIMES OF THIN METAL-FILMS
PHAN, HK
NGUYEN, TH
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 77 (02): : K135 - K138
[35] RAPID-DETERMINATION OF LONG GENERATION LIFETIME
ZHANG, X
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS, 1992, 139 (01): : 1 - 4
[36] EXPERIMENTAL AND THEORETICAL CONSIDERATIONS IN MEASUREMENTS OF LONG RELAXATION-TIMES AT LOW-TEMPERATURE
LOOK, DC
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (03): : 328 - 328
[37] NON-STEADY-STATE PHOTOVOLTAGE IN CRYSTALS WITH LONG PHOTOCONDUCTIVITY RELAXATION-TIMES
SOKOLOV, IA
STEPANOV, SI
ELECTRONICS LETTERS, 1990, 26 (16) : 1275 - 1277
[38] THE DOUBLE SWEEP HF-CV TECHNIQUE FOR GENERATION LIFETIME DETERMINATION IN MOS CAPACITORS
SORGE, R
SOLID-STATE ELECTRONICS, 1994, 37 (01) : 217 - 219
[39] APPLICATIONS OF ADIABATIC RAPID PASSAGE TO CORRELATION NMR-SPECTROSCOPY .2. MEASUREMENT OF SPIN-LATTICE RELAXATION-TIMES
OZAWA, H
ARATA, Y
CHEMISTRY LETTERS, 1975, (03) : 239 - 240
[40] ON THE MEASUREMENT OF SURFACE-STATE DENSITY AND DIFFUSION COMPONENT FROM BULK IN MOS CAPACITORS WITH LONG RELAXATION-TIME
SIENNICKI, A
ZALESKI, A
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1989, 36 (02) : 457 - 458

← 1 2 3 4 5 →