THE RAPID MEASUREMENT OF GENERATION LIFETIME IN MOS CAPACITORS WITH LONG RELAXATION-TIMES

被引：6
|
作者：
KELLER, WW
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1987年 / 34卷 / 05期
关键词：
D O I：
10.1109/T-ED.1987.23056
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1141 / 1146
页数：6
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