A CONSTANT IMPEDANCE FIXTURE FOR LOW-LEVEL INDUCTANCE MEASUREMENTS

被引：2

作者：

LAFFERTY, RE

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1991年 / 40卷 / 05期

关键词：

D O I：

10.1109/19.106313

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The measurement of low levels of inductance can incur substantial errors if the impedance of the circuit containing the test terminals is changed when changing from the zero to the test condition. A test fixture which avoids this problem is described.

引用

页码：862 / 863

页数：2