A LABORATORY EXAFS STUDY WITH HIGHER-ORDER BRAGG REFLECTION BY MEANS OF THE FLUORESCENCE MONITORING TECHNIQUE

被引：1

作者：

OMOTE, K

TOHJI, K

WASEDA, Y

机构：

[1] TOHOKU UNIV,DEPT RESOURCES ENGN,AOBA KU,SENDAI,MIYAGI 980,JAPAN

[2] TOHOKU UNIV,INST ADV MAT PROC,AOBA KU,SENDAI,MIYAGI 980,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷

关键词：

LABORATORY EXAFS; HIGHER-ORDER REFLECTION; FLUORESCENCE MONITORING;

D O I：

10.7567/JJAPS.32S2.264

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A Laboratory EXAFS study has been tested by using higher-order Bragg reflections of Ge(440), Ge(333) and Ge(444). A single crystal spectrometer was employed and the incident x-ray intensity was monitored by measuring the fluorescent radiation from a suitable material placed in front of a sample. Good EXAFS spectra were obtained for relatively heavy elements of Se, Y and Zr with this technique. In addition, high intensity photon fluxes have been obtained, which are 6 and 3 times stronger than the case of double-crystal spectrometer at photon energies of 12 and 16 keV, respectively.

引用

页码：264 / 266

页数：3