A LABORATORY EXAFS STUDY WITH HIGHER-ORDER BRAGG REFLECTION BY MEANS OF THE FLUORESCENCE MONITORING TECHNIQUE

A Laboratory EXAFS study has been tested by using higher-order Bragg reflections of Ge(440), Ge(333) and Ge(444). A single crystal spectrometer was employed and the incident x-ray intensity was monitored by measuring the fluorescent radiation from a suitable material placed in front of a sample. Good EXAFS spectra were obtained for relatively heavy elements of Se, Y and Zr with this technique. In addition, high intensity photon fluxes have been obtained, which are 6 and 3 times stronger than the case of double-crystal spectrometer at photon energies of 12 and 16 keV, respectively.