AMORPHOUS SURFACE AND QUANTITATIVE X-RAY-POWDER DIFFRACTOMETRY

被引：22

作者：

ALTREEWILLIAMS, S

BYRNES, JG

JORDAN, B

机构：

[1] GEOL SURVEY NEW S WALES, GEOL & MIN MUSEUM, SYDNEY, AUSTRALIA

[2] DEAKIN UNIV, DIV CHEM & PHYS SCI, GEELONG 3217, AUSTRALIA

来源：

ANALYST | 1981年 / 106卷 / 1258期

关键词：

D O I：

10.1039/an9810600069

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：69 / 75

页数：7

共 20 条

[1]

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[2] QUANTITATIVE X-RAY-DIFFRACTOMETRY ON MILLIGRAM SAMPLES PREPARED ON SILVER FILTERS [J].

ALTREEWILLIAMS, S .

ANALYTICAL CHEMISTRY, 1977, 49 (03) :429-432

[3] POLARIZATION-RATIO OF A DIFFRACTED-BEAM MONOCHROMATOR IN X-RAY-POWDER DIFFRACTOMETRY [J].

ALTREEWILLIAMS, S ;

JORDAN, B .

ANALYTICAL CHEMISTRY, 1980, 52 (08) :1296-1300

[4] CALCULATED X-RAY-DIFFRACTION DATA AND QUANTITATIVE X-RAY-DIFFRACTOMETRY [J].

ALTREEWILLIAMS, S .

ANALYTICAL CHEMISTRY, 1978, 50 (09) :1272-1275

[5] FREE SILICA ANALYSIS OF ENVIRONMENTAL SAMPLES - CRITICAL LITERATURE REVIEW [J].

ANDERSON, PL .

AMERICAN INDUSTRIAL HYGIENE ASSOCIATION JOURNAL, 1975, 36 (10) :767-778

[6]

BORG IY, 1969, 122 GEOL SOC AM MEM

[7]

HIGGINS RI, 1967, INHALED PARTICLES VA, V2, P575

[8] REFERENCE INTENSITY RATIO, I/IC, FOR COMPUTER-SIMULATED POWDER PATTERNS [J].

HUBBARD, CR ;

EVANS, EH ;

SMITH, DK .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1976, 9 (APR1) :169-174

[9]

HUBBARD CR, 1977, ADV XRAY ANAL, V20, P27

[10]

JEPHCOTT C M, 1955, AMA Arch Ind Health, V11, P425

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