THEORY OF ELECTRON MICROGRAPHS OF AMORPHOUS MATERIALS

被引:26
作者
COCHRAN, W [1 ]
机构
[1] IBM CORP,WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
PHYSICAL REVIEW B | 1973年 / 8卷 / 02期
关键词
D O I
10.1103/PhysRevB.8.623
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:623 / 629
页数:7
相关论文
共 12 条
[1]   DENSITIES OF AMORPHOUS SI FILMS BY NUCLEAR BACKSCATTERING [J].
BRODSKY, MH ;
KAPLAN, D ;
ZIEGLER, JF .
APPLIED PHYSICS LETTERS, 1972, 21 (07) :305-&
[2]   ELECTRON-MICROSCOPE INVESTIGATION OF STRUCTURE OF SOME AMORPHOUS MATERIALS [J].
CHAUDHARI, P ;
HERD, SR ;
GRACZYK, JF .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1972, 51 (02) :801-+
[3]   COHERENT SCATTERING IN A RANDOM-NETWORK MODEL FOR AMORPHOUS SOLIDS [J].
CHAUDHARI, P ;
CHARBNAU, HP ;
GRACZYK, JF .
PHYSICAL REVIEW LETTERS, 1972, 29 (07) :425-+
[4]  
Herman F., 1972, J NON-CRYST SOLIDS, V8-10, P359, DOI [10.1016/0022-3093(72)90160-3, DOI 10.1016/0022-3093(72)90160-3]
[5]  
HIRSCH PB, 1965, ELECTRON MICROSCOPY
[6]   INTERPRETATION OF ELECTRON MICROGRAPHS AND DIFFRACTION PATTERNS OF AMORPHOUS MATERIALS [J].
HOWIE, A ;
KRIVANEK, OL ;
RUDEE, ML .
PHILOSOPHICAL MAGAZINE, 1973, 27 (01) :235-255
[7]   3-DIMENSIONAL IMAGE RECONSTRUCTION FROM VIEWPOINT OF INFORMATION-THEORY [J].
KLUG, A ;
CROWTHER, RA .
NATURE, 1972, 238 (5365) :435-+
[8]   EVIDENCE OF VOIDS WITHIN AS-DEPOSITED STRUCTURE OF GLASSY SILICON [J].
MOSS, SC ;
GRACZYK, JF .
PHYSICAL REVIEW LETTERS, 1969, 23 (20) :1167-&
[9]  
Polk D. E., 1971, Journal of Non-Crystalline Solids, V5, P365, DOI 10.1016/0022-3093(71)90038-X
[10]   STRUCTURE OF AMORPHOUS SI AND GE [J].
RUDEE, ML ;
HOWIE, A .
PHILOSOPHICAL MAGAZINE, 1972, 25 (04) :1001-&