2-DIMENSIONAL ANALYTIC MODELING OF VERY THIN SOI MOSFETS

被引:55
作者
WOO, JCS
TERRILL, KW
VASUDEV, PK
机构
[1] INTEGRATED DEVICE TECHNOL,SANTA CLARA,CA
[2] SEMATECH,AUSTIN,TX
关键词
D O I
10.1109/16.57162
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An analytic solution of the Poisson’s equation for MOSFET’s on very thin SOI was developed using an infinite series method. The calculation region includes both the thin SOI as well as the gate and buried oxides. The results of this model were found to agree well with a two-dimensional (PISCES) simulation in the subthreshold region and the linear region with small VDS. This model is used to study the short-channel behavior of very small MOS transistors on thin SOI. It is found that with very thin SOI, short-channel effects are much reduced compared to bulk MOS transistors and depend on the bulk-substrate bias. In addition, the model also shows that it is possible to fabricate submicrometer transistors on very thin SOI even if the channel doping is nearly intrinsic. © 1990 IEEE
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页码:1999 / 2006
页数:8
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