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2-DIMENSIONAL ANALYTIC MODELING OF VERY THIN SOI MOSFETS
被引:55
作者
:
WOO, JCS
论文数:
0
引用数:
0
h-index:
0
机构:
INTEGRATED DEVICE TECHNOL,SANTA CLARA,CA
WOO, JCS
TERRILL, KW
论文数:
0
引用数:
0
h-index:
0
机构:
INTEGRATED DEVICE TECHNOL,SANTA CLARA,CA
TERRILL, KW
VASUDEV, PK
论文数:
0
引用数:
0
h-index:
0
机构:
INTEGRATED DEVICE TECHNOL,SANTA CLARA,CA
VASUDEV, PK
机构
:
[1]
INTEGRATED DEVICE TECHNOL,SANTA CLARA,CA
[2]
SEMATECH,AUSTIN,TX
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1990年
/ 37卷
/ 09期
关键词
:
D O I
:
10.1109/16.57162
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
An analytic solution of the Poisson’s equation for MOSFET’s on very thin SOI was developed using an infinite series method. The calculation region includes both the thin SOI as well as the gate and buried oxides. The results of this model were found to agree well with a two-dimensional (PISCES) simulation in the subthreshold region and the linear region with small VDS. This model is used to study the short-channel behavior of very small MOS transistors on thin SOI. It is found that with very thin SOI, short-channel effects are much reduced compared to bulk MOS transistors and depend on the bulk-substrate bias. In addition, the model also shows that it is possible to fabricate submicrometer transistors on very thin SOI even if the channel doping is nearly intrinsic. © 1990 IEEE
引用
收藏
页码:1999 / 2006
页数:8
相关论文
共 21 条
[1]
TRANSCONDUCTANCE OF SILICON-ON-INSULATOR (SOI) MOSFETS
COLINGE, JP
论文数:
0
引用数:
0
h-index:
0
COLINGE, JP
[J].
IEEE ELECTRON DEVICE LETTERS,
1985,
6
(11)
: 573
-
574
[2]
REDUCTION OF KINK EFFECT IN THIN-FILM SOI MOSFETS
COLINGE, JP
论文数:
0
引用数:
0
h-index:
0
COLINGE, JP
[J].
IEEE ELECTRON DEVICE LETTERS,
1988,
9
(02)
: 97
-
99
[3]
HOT-ELECTRON EFFECTS IN SILICON-ON-INSULATOR N-CHANNEL MOSFET
COLINGE, JP
论文数:
0
引用数:
0
h-index:
0
COLINGE, JP
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1987,
34
(10)
: 2173
-
2177
[4]
TWO-DIMENSIONAL NUMERICAL-ANALYSIS OF THE FLOATING REGION IN SOI MOSFETS
EDWARDS, SP
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC,B-3030 HEVERLEE,BELGIUM
IMEC,B-3030 HEVERLEE,BELGIUM
EDWARDS, SP
YALLUP, KJ
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC,B-3030 HEVERLEE,BELGIUM
IMEC,B-3030 HEVERLEE,BELGIUM
YALLUP, KJ
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC,B-3030 HEVERLEE,BELGIUM
IMEC,B-3030 HEVERLEE,BELGIUM
DEMEYER, KM
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1988,
35
(07)
: 1012
-
1020
[5]
VERY SMALL MOSFETS FOR LOW-TEMPERATURE OPERATION
GAENSSLEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
GAENSSLEN, FH
RIDEOUT, VL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
RIDEOUT, VL
WALKER, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
WALKER, EJ
WALKER, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
WALKER, JJ
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1977,
24
(03)
: 218
-
229
[6]
NONPLANAR VLSI DEVICE ANALYSIS USING THE SOLUTION OF POISSON EQUATION
GREENFIELD, JA
论文数:
0
引用数:
0
h-index:
0
GREENFIELD, JA
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
DUTTON, RW
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
: 1520
-
1532
[7]
NGUYEN TN, 1984, G5452 STANF ICL TECH
[8]
NGUYEN TN, 1984, IEDM, P596
[9]
Nicollian E. H., 1982, METAL OXIDE SEMICOND
[10]
PERFORMANCE LIMITS OF CMOS ULSI
PFIESTER, JR
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
PFIESTER, JR
SHOTT, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
SHOTT, JD
MEINDL, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
MEINDL, JD
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
: 333
-
343
←
1
2
3
→
共 21 条
[1]
TRANSCONDUCTANCE OF SILICON-ON-INSULATOR (SOI) MOSFETS
COLINGE, JP
论文数:
0
引用数:
0
h-index:
0
COLINGE, JP
[J].
IEEE ELECTRON DEVICE LETTERS,
1985,
6
(11)
: 573
-
574
[2]
REDUCTION OF KINK EFFECT IN THIN-FILM SOI MOSFETS
COLINGE, JP
论文数:
0
引用数:
0
h-index:
0
COLINGE, JP
[J].
IEEE ELECTRON DEVICE LETTERS,
1988,
9
(02)
: 97
-
99
[3]
HOT-ELECTRON EFFECTS IN SILICON-ON-INSULATOR N-CHANNEL MOSFET
COLINGE, JP
论文数:
0
引用数:
0
h-index:
0
COLINGE, JP
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1987,
34
(10)
: 2173
-
2177
[4]
TWO-DIMENSIONAL NUMERICAL-ANALYSIS OF THE FLOATING REGION IN SOI MOSFETS
EDWARDS, SP
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC,B-3030 HEVERLEE,BELGIUM
IMEC,B-3030 HEVERLEE,BELGIUM
EDWARDS, SP
YALLUP, KJ
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC,B-3030 HEVERLEE,BELGIUM
IMEC,B-3030 HEVERLEE,BELGIUM
YALLUP, KJ
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC,B-3030 HEVERLEE,BELGIUM
IMEC,B-3030 HEVERLEE,BELGIUM
DEMEYER, KM
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1988,
35
(07)
: 1012
-
1020
[5]
VERY SMALL MOSFETS FOR LOW-TEMPERATURE OPERATION
GAENSSLEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
GAENSSLEN, FH
RIDEOUT, VL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
RIDEOUT, VL
WALKER, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
WALKER, EJ
WALKER, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
WALKER, JJ
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1977,
24
(03)
: 218
-
229
[6]
NONPLANAR VLSI DEVICE ANALYSIS USING THE SOLUTION OF POISSON EQUATION
GREENFIELD, JA
论文数:
0
引用数:
0
h-index:
0
GREENFIELD, JA
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
DUTTON, RW
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
: 1520
-
1532
[7]
NGUYEN TN, 1984, G5452 STANF ICL TECH
[8]
NGUYEN TN, 1984, IEDM, P596
[9]
Nicollian E. H., 1982, METAL OXIDE SEMICOND
[10]
PERFORMANCE LIMITS OF CMOS ULSI
PFIESTER, JR
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
PFIESTER, JR
SHOTT, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
SHOTT, JD
MEINDL, JD
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
STANFORD UNIV,DEPT ELECT ENGN,STANFORD,CA 94305
MEINDL, JD
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
: 333
-
343
←
1
2
3
→