MECHANISM FOR ANNEALING-INDUCED CHANGES IN THE ELECTRICAL CHARACTERISTICS OF AL/GAAS AND AL/INP SCHOTTKY CONTACTS

被引：36
作者：
NEWMAN, N [1 ]
SPICER, WE [1 ]
WEBER, ER [1 ]
机构：
[1] UNIV CALIF BERKELEY,DEPT MAT SCI,BERKELEY,CA 94720
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 04期
关键词：
D O I：
10.1116/1.583766
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1020 / 1029
页数：10
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