MEASUREMENTS OF SUB-MICRON HOLE DIFFUSION LENGTHS IN GAAS BY A PHOTO-VOLTAIC TECHNIQUE

被引：9

作者：

DORANTESDAVILA, J ^{[1
]}

LASTRASMARTINEZ, A ^{[1
]}

RACCAH, PM ^{[1
]}

机构：

[1] UNIV ILLINOIS,DEPT PHYS,CHICAGO,IL 60680

来源：

APPLIED PHYSICS LETTERS | 1981年 / 38卷 / 06期

关键词：

D O I：

10.1063/1.92390

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：442 / 444

页数：3

共 14 条

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[4]

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[8]

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[9] MINORITY-CARRIER DIFFUSION LENGTH MEASUREMENTS IN CDTE BY A PHOTOCURRENT TECHNIQUE [J].

LASTRASMARTINEZ, A ;

RACCAH, PM ;

TRIBOULET, R .

APPLIED PHYSICS LETTERS, 1980, 36 (06) :469-471

[10] ABSORPTION EDGE OF GAAS AND ITS DEPENDENCE ON ELECTRIC FIELD [J].

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REES, HD .

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