DIGITAL RECONSTRUCTION OF BRIGHT FIELD PHASE-CONTRAST IMAGES FROM HIGH-RESOLUTION ELECTRON-MICROGRAPHS

被引：35
作者：
KIRKLAND, EJ [1 ]
SIEGEL, BM [1 ]
UYEDA, N [1 ]
FUJIYOSHI, Y [1 ]
机构：
[1] KYOTO UNIV,INST CHEM RES,UJI,KYOTO 611,JAPAN
来源：
ULTRAMICROSCOPY | 1980年 / 5卷 / 04期
关键词：
Compendex;
D O I：
10.1016/S0304-3991(80)80006-4
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
IMAGE PROCESSING
引用
收藏
页码：479 / 503
页数：25
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