首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
Secondary emission and electron diffraction on the glass surface
被引:7
作者
:
Kamogawa, H
论文数:
0
引用数:
0
h-index:
0
机构:
Tokyo Shibaura Elect Co, Matsuda Div, Res Lab, Kawasaki, Japan
Tokyo Shibaura Elect Co, Matsuda Div, Res Lab, Kawasaki, Japan
Kamogawa, H
[
1
]
机构
:
[1]
Tokyo Shibaura Elect Co, Matsuda Div, Res Lab, Kawasaki, Japan
来源
:
PHYSICAL REVIEW
|
1940年
/ 58卷
/ 07期
关键词
:
D O I
:
10.1103/PhysRev.58.660
中图分类号
:
O4 [物理学];
学科分类号
:
0702 ;
摘要
:
引用
收藏
页码:660 / 660
页数:1
相关论文
共 5 条
[1]
BEILBY, 1903, P ROY SOC A, V72, P220
[2]
Structure of oxidized silicon film
Kamogawa, H
论文数:
0
引用数:
0
h-index:
0
机构:
Tokyo Elect Co, Res Lab, Kawasaki, Japan
Tokyo Elect Co, Res Lab, Kawasaki, Japan
Kamogawa, H
[J].
PHYSICAL REVIEW,
1938,
54
(01):
: 91
-
91
[3]
MAXWELL LR, 1935, PHYS REV, V47, P331
[4]
RAYLEIGH, 1936, P ROY SOC A, V156, P329
[5]
Salow H., 1940, Z TECH PHYS, V21, P8
←
1
→
共 5 条
[1]
BEILBY, 1903, P ROY SOC A, V72, P220
[2]
Structure of oxidized silicon film
Kamogawa, H
论文数:
0
引用数:
0
h-index:
0
机构:
Tokyo Elect Co, Res Lab, Kawasaki, Japan
Tokyo Elect Co, Res Lab, Kawasaki, Japan
Kamogawa, H
[J].
PHYSICAL REVIEW,
1938,
54
(01):
: 91
-
91
[3]
MAXWELL LR, 1935, PHYS REV, V47, P331
[4]
RAYLEIGH, 1936, P ROY SOC A, V156, P329
[5]
Salow H., 1940, Z TECH PHYS, V21, P8
←
1
→