CHARACTERIZATION OF THE STRENGTH AND ADHESION OF DIAMOND FILMS ON METALLIC SUBSTRATES USING A SUBSTRATE PLASTIC STRAINING TECHNIQUE

被引:17
作者
CHANDRA, L
CLYNE, TW
机构
[1] Department of Materials Science and Metallurgy, Cambridge, CB2 3QZ, Pembroke Street
关键词
D O I
10.1016/0925-9635(94)90271-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Diamond films have been deposited by microwave plasma-assisted CVD on two different metallic substrates (304 stainless steel and Ti-6Al-4V). The film thickness was also varied within the range of a few micrometres. The strength and adhesion of these coatings have been measured by a substrate plastic straining technique. The information about the distribution of the crack spacing has been utilized to estimate the Weibull moduli of the films. The data presented in this paper indicate that the films exhibit excellent adhesion to the substrates. The average strength of the films appears to be greater for lower thicknesses. The films on titanium substrates show greater strengths and a somewhat higher value of Weibull modulus.
引用
收藏
页码:791 / 798
页数:8
相关论文
共 20 条
  • [1] MEASUREMENT OF THE ULTIMATE SHEAR-STRENGTH OF A METAL CERAMIC INTERFACE
    AGRAWAL, DC
    RAJ, R
    [J]. ACTA METALLURGICA, 1989, 37 (04): : 1265 - 1270
  • [2] BULL SJ, 1992, MATER SCI TECH SER, V8, P679, DOI 10.1179/026708392790171143
  • [3] FRACTURE STRENGTH MEASUREMENT OF FILAMENT ASSISTED CVD POLYCRYSTALLINE DIAMOND FILMS
    CARDINALE, GF
    ROBINSON, CJ
    [J]. JOURNAL OF MATERIALS RESEARCH, 1992, 7 (06) : 1432 - 1437
  • [4] USE OF AN ULTRASONIC RESONANCE TECHNIQUE TO MEASURE THE INPLANE YOUNGS MODULUS OF THIN DIAMOND FILMS DEPOSITED BY A DC PLASMA-JET
    CHANDRA, L
    CLYNE, TW
    [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1993, 12 (03) : 191 - 195
  • [5] POSSIBLE TECHNIQUE FOR THE CHARACTERIZATION OF DIAMOND FILMS USING AN ULTRASONIC RESONANCE TECHNIQUE
    CHANDRA, L
    CLYNE, TW
    [J]. DIAMOND AND RELATED MATERIALS, 1993, 2 (5-7) : 977 - 983
  • [6] DEVELOPMENT OF A TEST METHOD FOR MEASURING THE MIXED-MODE FRACTURE-RESISTANCE OF BIMATERIAL INTERFACES
    CHARALAMBIDES, PG
    CAO, HC
    LUND, J
    EVANS, AG
    [J]. MECHANICS OF MATERIALS, 1990, 8 (04) : 269 - 283
  • [7] A test specimen for determining the fracture resistarim of bimaterial interfaces
    Charalambides, PG
    Lund, J
    Evans, AG
    McMeeking, RM
    [J]. JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1989, 56 (01): : 77 - 82
  • [8] THE FRACTURE ENERGY OF BIMATERIAL INTERFACES
    EVANS, AG
    RUHLE, M
    DALGLEISH, BJ
    CHARALAMBIDES, PG
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1990, 126 : 53 - 64
  • [9] ADHESION OF POLYCRYSTALLINE DIAMOND THIN-FILMS ON SINGLE-CRYSTAL SILICON SUBSTRATES
    GAMLEN, CA
    CASE, ED
    REINHARD, DK
    HUANG, B
    [J]. APPLIED PHYSICS LETTERS, 1991, 59 (20) : 2529 - 2531
  • [10] INTERFACE MODIFICATIONS FOR IMPROVING THE ADHESION OF ALPHA-C-H FILMS TO METALS
    GRILL, A
    MEYERSON, B
    PATEL, V
    [J]. JOURNAL OF MATERIALS RESEARCH, 1988, 3 (02) : 214 - 218