Thermal plasma chemical vapor deposition of SiC

被引:5
作者
Kojima, Y
Andoo, Y
Doi, M
机构
[1] Hitachi Research Laboratory, Hitachi Ltd., Hitachi, Ibaraki-ken 319-12, Omika-cho
关键词
chemical vapor deposition; thermal plasma jet; spectral analysis; SiC film;
D O I
10.2355/isijinternational.35.1381
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
To develop a new surface modification capable of controlling the film quality at a high deposition rate, a Chemical Vapor Deposition (CVD) process using thermal plasma jet was studied. In this work, a method of most suitably supplying reaction gas into thermal plasma jet which was a high velocity flow was examined using spectral analysis by a two-dimensional imaging spectrometer. A SiC film was deposited on graphite using SiCl4 and CH4 as reaction gases and Ar-10%H-2 gases as plasma forming gases. The maximum deposition rate of 2.78 x 10(-7) m/sec was obtained by supplying each of the above reaction gases in an amount of 2.67 x 10(-5) m(3)/sec. The deposited SIC film was a columnar structure, the hardness being about HV 2400.
引用
收藏
页码:1381 / 1387
页数:7
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