ENERGY-LOSS SPECTROMETRY WITH A LARGE COLLECTION ANGLE

被引：8
作者：
EGERTON, RF
机构：
来源：
ULTRAMICROSCOPY | 1981年 / 7卷 / 02期
关键词：
D O I：
10.1016/0304-3991(81)90013-9
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：207 / 210
页数：4
相关论文
共 20 条
[1]  
BOYCE JF, 1980, J PHYS D, P471
[2]   CONTRIBUTION OF ELECTRON-ENERGY LOSS SPECTROSCOPY TO DEVELOPMENT OF ANALYTICAL ELECTRON-MICROSCOPY [J].
COLLIEX, C ;
COSSLETT, VE ;
LEAPMAN, RD ;
TREBBIA, P .
ULTRAMICROSCOPY, 1976, 1 (04) :301-315
[3]   FORMULAS FOR LIGHT-ELEMENT MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROMETRY [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1978, 3 (02) :243-251
[4]   K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1979, 4 (02) :169-179
[5]  
EGERTON RF, 1980, OPTIK, V56, P363
[6]  
EGERTON RF, 1981, 39TH ANN P EL MICR S
[7]  
EGERTON RF, 1976, DEV ELECTRON MICROSC, P129
[8]  
EGERTON RF, 1981, ANAL ELECTRON MICROS
[9]  
GOLDSTEIN JI, 1979, INTRO ANAL ELECTRON, pCH3
[10]  
ISAACSON M, 1978, SCANNING ELECTRON MI, V1, P763
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