MEASUREMENT OF CHARACTERISTICS OF SEMICONDUCTOR-LASER EMITTERS BY TEMPERATURE-JUMP METHOD

被引：0
|
作者：
ERZIKOV, AP
KUDRYASHOV, OV
机构：
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1991年 / 34卷 / 02期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A method for measurement of the temperature characteristics of semiconductor laser emitters in the range of +/- 10-degrees-C (with respect to the ambient temperature) with a resolution of 0.01-degrees-C is described. The measurement time of a characteristic containing up to 600 points is 1.5-2 min.
引用
收藏
页码：470 / 474
页数：5
相关论文
共 50 条
12345