AN INSPECTION POLICY FOR UNREVEALED FAILURES IN A 2-UNIT COLD STANDBY SYSTEM SUBJECT TO CORRELATED FAILURES AND REPAIRS

被引：3
|
作者：
GOEL, LR
MUMTAZ, SZ
机构：
[1] Department of Statistics, Institute of Advanced Studies, Meerut University, Meerut
来源：
MICROELECTRONICS AND RELIABILITY | 1994年 / 34卷 / 07期
关键词：
Bivariate exponential - Inspection policy - Mean time to system failure - Regenerative point technique - Revealed failure - Stochastic analysis - Two unit cold standby system - Unrevealed failure;
D O I：
10.1016/0026-2714(94)90516-9
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper considers the stochastic analysis of a two-unit (dissimilar units) cold standby system subject to revealed and unrevealed failures. We assume that a revealed failure is detected as soon as it occurs but an unrevealed failure is detected by an inspection only. Failure and repair times are assumed to be correlated and their joint distributions are taken to be bivariate exponential (B.V.e.). Important reliability characteristics useful to system designers are obtained by using the regenerative point technique.
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页码：1279 / 1282
页数：4
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