GLANCING-INCIDENCE X-RAY-ANALYSIS

被引：35
|
作者：
VANDENHOOGENHOF, WW [1 ]
DEBOER, DKG [1 ]
机构：
[1] PHILIPS RES LABS, 5600 JA EINDHOVEN, NETHERLANDS
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1993年 / 48卷 / 02期
关键词：
D O I：
10.1016/0584-8547(93)80034-R
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The ever-increasing interest in ever-decreasing structural details of materials has led to specialized methods such as total-reflection X-ray fluorescence spectrometry (TXRF). Combining the angular dependence of TXRF with reflectivity experiments in the same instrument opens the field of glancing incidence X-ray analysis (GIXA), which offers the possibility for detailed analysis of flat (layered) samples. In this paper, the various types of measurement are described and their information content is discussed. Furthermore, the role of interface roughness is indicated. With some examples it is shown how the complementary data yield a detailed analysis of a sample.
引用
收藏
页码：277 / 284
页数：8
相关论文
共 50 条
  • [41] X-RAY-ANALYSIS OF IONOMERS
    REGISTER, RA
    DING, YS
    FOUCART, M
    JEROME, R
    HUBBARD, SR
    HODGSON, KO
    COOPER, SL
    ACS SYMPOSIUM SERIES, 1989, 395 : 420 - 438
  • [42] STRUCTURE DETERMINATION OF METASTABLE EPITAXIAL CU LAYERS ON AG(001) BY GLANCING-INCIDENCE X-RAY-ABSORPTION FINE-STRUCTURE
    JIANG, DT
    CROZIER, ED
    HEINRICH, B
    PHYSICAL REVIEW B, 1991, 44 (12): : 6401 - 6409
  • [43] ADVANCES IN X-RAY-ANALYSIS
    MULLER, R
    ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-LEIPZIG, 1965, 228 (3-4): : 285 - &
  • [44] Glancing incidence X-ray analysis: More than just reflectivity
    Leenaers, AJG
    Vrakking, JJAM
    deBoer, DKG
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1997, 52 (07) : 805 - 812
  • [45] Investigation of substrate rotation at glancing-incidence on thin-film morphology
    Dick, B
    Brett, MJ
    Smy, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (06): : 2569 - 2575
  • [46] A GAS-FLOW ELECTRON YIELD DETECTOR FOR GLANCING-INCIDENCE EXAFS
    JIANG, DT
    CROZIER, ED
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1990, 294 (03): : 666 - 668
  • [47] SYNCHROTRON RADIATION X-RAY-ANALYSIS
    GOHSHI, Y
    TRANSACTIONS OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1987, 27 (02) : B40 - B40
  • [48] IS ACCURATE X-RAY-ANALYSIS WORTHWHILE
    DUNITZ, JD
    BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1988, 61 (01) : 1 - 11
  • [49] X-RAY-ANALYSIS OF SPHERICAL VIRUSES
    MORGUNOVA, EY
    MIKHAILOV, AM
    VAINSHTEIN, BK
    MOLECULAR BIOLOGY, 1993, 27 (02) : 225 - 232
  • [50] X-RAY-ANALYSIS FOR PRODUCTION CONTROL
    PRICE, BJ
    AMERICAN LABORATORY, 1981, 13 (08) : 66 - 71
12345