GLANCING-INCIDENCE X-RAY-ANALYSIS

被引：35
|
作者：
VANDENHOOGENHOF, WW [1 ]
DEBOER, DKG [1 ]
机构：
[1] PHILIPS RES LABS, 5600 JA EINDHOVEN, NETHERLANDS
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1993年 / 48卷 / 02期
关键词：
D O I：
10.1016/0584-8547(93)80034-R
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The ever-increasing interest in ever-decreasing structural details of materials has led to specialized methods such as total-reflection X-ray fluorescence spectrometry (TXRF). Combining the angular dependence of TXRF with reflectivity experiments in the same instrument opens the field of glancing incidence X-ray analysis (GIXA), which offers the possibility for detailed analysis of flat (layered) samples. In this paper, the various types of measurement are described and their information content is discussed. Furthermore, the role of interface roughness is indicated. With some examples it is shown how the complementary data yield a detailed analysis of a sample.
引用
收藏
页码：277 / 284
页数：8
相关论文
共 50 条
  • [31] Nondestructive evaluation of alternative substrate quality using glancing-incidence x-ray diffraction and Raman spectroscopy
    Haugan, HJ
    Cain, AM
    Haas, TW
    Eyink, KG
    Eiting, CJ
    Tomich, DH
    Grazulis, L
    Busbee, JD
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2003, 21 (01): : 110 - 115
  • [32] Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery
    E. Bontempi
    P. Colombi
    L.E. Depero
    L. Cartechini
    F. Presciutti
    B.G. Brunetti
    A. Sgamellotti
    Applied Physics A, 2006, 83 : 543 - 546
  • [33] Glancing-incidence X-ray analysis of ZnO thin films and ZnO/ZnMgO hetero structures grown by laser-MBE
    Yang, XD
    Zhang, JW
    Bi, Z
    He, YN
    Xu, Q
    Wang, HB
    Zhang, WF
    Hou, X
    JOURNAL OF CRYSTAL GROWTH, 2005, 284 (1-2) : 123 - 128
  • [34] Glancing-incidence and -take-off x-ray fluorescence and scanning tunnelling microscopy of thin films under x-ray irradiation
    Tsuji, K
    Hirokawa, K
    SURFACE AND INTERFACE ANALYSIS, 1996, 24 (04) : 286 - 289
  • [35] SI/SIO2 INTERFACE-DEPTH DETERMINATION IN GLANCING-INCIDENCE X-RAY-DIFFRACTION EXPERIMENTS
    ALEKSANDROV, PA
    BELOVA, NE
    FANCHENKO, SS
    POLANDOVA, IX
    ACTA CRYSTALLOGRAPHICA SECTION A, 1993, 49 : 893 - 894
  • [36] ANGULAR SCANNING STAGE FOR GLANCING-INCIDENCE SURFACE EXAFS
    JIANG, DT
    ALBERDING, N
    SEARY, AJ
    CROZIER, ED
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (01): : 60 - 63
  • [37] X-RAY-ANALYSIS
    不详
    CHEMICAL & ENGINEERING NEWS, 1987, 65 (12) : 75 - 76
  • [38] Nondestructive depth profiling of oxidized Fe-Cr alloy by the glancing-incidence and -takeoff X-ray fluorescence method
    Tsuji, K
    Hirokawa, K
    APPLIED SURFACE SCIENCE, 1996, 103 (04) : 451 - 458
  • [39] THIN-LAYER STRUCTURE INVESTIGATIONS IN THE GLANCING-INCIDENCE X-RAY-DIFFRACTION EXPERIMENTS FAR FROM THE BRAGG POINT
    ALEKSANDROV, PA
    BELOVA, NE
    FANCHENKO, SS
    POLANDOVA, IX
    PHYSICA B, 1994, 198 (1-3): : 60 - 62
  • [40] Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry
    Wiener, G
    Gunther, R
    Michaelsen, C
    Knoth, J
    Schwenke, H
    Bormann, R
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1997, 52 (07) : 813 - 821
12345