HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING STUDY FROM NEARLY PERFECT SILICON SINGLE-CRYSTALS

被引：28
作者：
LAL, K
SINGH, BP
VERMA, AR
机构：
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1979年 / 35卷 / MAR期
关键词：
D O I：
10.1107/S0567739479000607
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
[No abstract available]
引用
收藏
页码：286 / 295
页数：10
相关论文
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