DESIGN PROPERTIES OF POLYCRYSTALLINE SILICON

被引:44
作者
KAMINS, TI
机构
[1] Hewlett-Packard, Palo Alto, CA 94303-0867
关键词
D O I
10.1016/0924-4247(90)87039-L
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Polycrystalline silicon is used in a variety of sensor applications, in which stress and other mechanical effects can dominate the device behavior. The. © 1990.
引用
收藏
页码:817 / 824
页数:8
相关论文
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