Size investigation of silicon nanoclusters deposited on HOPG using noncontact atomic force microscopy

被引:2
作者
Koc, Mumin Mehmet [1 ,2 ]
机构
[1] Univ Portsmouth, Sch Engn, Adv Mat Engn, Portsmouth, Hants, England
[2] Kirklareli Univ, Fac Sci & Literature, Dept Phys, Kirklareli, Turkey
来源
TURKISH JOURNAL OF PHYSICS | 2018年 / 42卷 / 04期
关键词
Silicon nanoparticles; highly oriented pyrolytic graphite; atomic force microscopy; size analysis;
D O I
10.3906/fiz-1804-5
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The sizes of silicon nanoparticles produced using two different novel methods are investigated in this report. The method of production used to generate silicon oxide nanoparticles was achieved via gas aggregation codeposition with water on a cold target, and also via a liquid jet method. The nanoparticles were drop-cast on a highly oriented pyrolytic graphite (HOPG) substrate and assessed using ultrahigh vacuum atomic force microscopy (AFM). Noncontact constant force mode was used in the AFM investigations. The silicon nanoparticles produced using the gas aggregation and water codeposition method were found to be smaller than 2 nm. A degree of deviation in the measured sizes of the silicon nanoparticles in different layers was detected. The size deviation was attributed to surface-nanoparticle, surface-tip, and nanoparticle-tip interactions. Silicon nanoparticles produced in alcohol using the liquid jet method were also found to be smaller than 2 nm. The solvent used for the silicon nanoparticles was varied in our investigations. When water was used as a solvent, a size deviation for silicon nanoparticles in different layers was also observed.
引用
收藏
页码:455 / +
页数:16
相关论文
共 39 条
[1]   Structural properties of nanoclusters: Energetic, thermodynamic, and kinetic effects [J].
Baletto, F ;
Ferrando, R .
REVIEWS OF MODERN PHYSICS, 2005, 77 (01) :371-423
[2]   Plasma synthesis of single-crystal silicon nanoparticles for novel electronic device applications [J].
Bapat, A ;
Anderson, C ;
Perrey, CR ;
Carter, CB ;
Campbell, SA ;
Kortshagen, U .
PLASMA PHYSICS AND CONTROLLED FUSION, 2004, 46 :B97-B109
[3]   Hamaker constants of inorganic materials [J].
Bergstrom, L .
ADVANCES IN COLLOID AND INTERFACE SCIENCE, 1997, 70 :125-169
[4]   In situ passivation and blue luminescence of silicon clusters using a cluster beam/H2O codeposition production method [J].
Brewer, A. ;
von Haeften, K. .
APPLIED PHYSICS LETTERS, 2009, 94 (26)
[5]   INTERLAYER MASS-TRANSPORT IN HOMOEPITAXIAL AND HETEROEPITAXIAL METAL GROWTH [J].
BROMANN, K ;
BRUNE, H ;
RODER, H ;
KERN, K .
PHYSICAL REVIEW LETTERS, 1995, 75 (04) :677-680
[6]  
Brune H, 1998, SURF SCI REP, V31, P121, DOI 10.1016/S0167-5729(99)80001-6
[7]   Clusters: Structure, energetics, and dynamics of intermediate states of matter [J].
Castleman, AW ;
Bowen, KH .
JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (31) :12911-12944
[8]  
Erogbogbo F., 2006, MRS P, V958, P908
[9]   Nanoalloys: From theory to applications of alloy clusters and nanoparticles [J].
Ferrando, Riccardo ;
Jellinek, Julius ;
Johnston, Roy L. .
CHEMICAL REVIEWS, 2008, 108 (03) :845-910
[10]   Size effects on the optical properties of organic nanoparticles [J].
Fu, HB ;
Yao, JN .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2001, 123 (07) :1434-1439