X-RAY TOTAL EXTERNAL REFLECTION FLUORESCENCE STUDY OF LB FILMS ON SOLID SUBSTRATE

被引：14
作者：
ZHELUDEVA, SI
KOVALCHUK, MV
NOVIKOVA, NN
SOSPHENOV, AN
EROCHIN, VE
FEIGIN, LA
机构：
[1] A V Shubnikcv Institute of Crystallography, Russian Academy of Sciences, Moscow, 117333, Leninsky pr
来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1993年 / 26卷 / 4A期
关键词：
D O I：
10.1088/0022-3727/26/4A/042
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The distribution of heavy ions inside a thin LB film and the structure perfection of organic layers have been studied by registering fluorescence excited by x-ray evanescent/standing wave fields under conditions of total external reflection. The possibility of the application of new complicated artificial multilayer systems as substrates for structure characterization of LB films deposited on them was revealed.
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页码：A202 / A205
页数：4
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