AN X-RAY SPECTROMETER FOR INELASTIC-SCATTERING EXPERIMENTS .1. CURVED-CRYSTAL X-RAY OPTICS

被引：33
|
作者：
SUORTTI, P [1 ]
PATTISON, P [1 ]
WEYRICH, W [1 ]
机构：
[1] UNIV CONSTANCE,FAK CHEM,D-7750 CONSTANCE,FED REP GER
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1986年 / 19卷
关键词：
D O I：
10.1107/S0021889886089264
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：336 / 342
页数：7
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