AN X-RAY SPECTROMETER FOR INELASTIC-SCATTERING EXPERIMENTS .1. CURVED-CRYSTAL X-RAY OPTICS

被引：33

作者：

SUORTTI, P ^{[1
]}

PATTISON, P ^{[1
]}

WEYRICH, W ^{[1
]}

机构：

[1] UNIV CONSTANCE,FAK CHEM,D-7750 CONSTANCE,FED REP GER

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1986年 / 19卷

关键词：

D O I：

10.1107/S0021889886089264

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：336 / 342

页数：7

共 15 条

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