ELECTRON MICRO-PROBE ANALYSIS OF SUB-MICRON LAYERS

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WEISWEILER, W
NEFF, R
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O65 [分析化学];
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070302 ; 081704 ;
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页码:373 / 383
页数:11
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[1]   SIMPLE METHOD OF THIN-FILM ANALYSIS IN ELECTRON-PROBE MICROANALYZER [J].
BISHOP, HE ;
POOLE, DM .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (09) :1142-1158
[2]  
BRONSTEIN IN, 1975, TASCHENBUCH MATH, P65
[3]  
HANTSCHE H, 1974, MIKROCHIM ACTA, P73
[4]  
HUTCHINS GA, 1960, ELECTRON MICROPROBE, P390
[5]  
KONIG R, 1975, BEITR ELEKTRONENMIKR, V8, P29
[6]  
MARSHALL DJ, 1968, BRIT J APPL PHYS, V2, P1651
[7]   ELECTRON PENETRATION AND ATOMIC NUMBER CORRECTION IN ELECTRON PROBE MICROANALYSIS [J].
PHILIBERT, J ;
TIXIER, R .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (06) :685-+
[8]  
Reuter W., 1972, 6 INT C XRAY OPT MIC, P121
[9]  
SCHMIDT D, 1973, BEITR ELEKTRONENMIKR, V6, P55
[10]  
SCHRADER M, 1979, MIKROCHIM ACTA WI S8, P377