A precision x-ray spectrometer and the wave length of MoK alpha(1)

被引：41
作者：
Compton, AH [1 ]
机构：
[1] Univ Chicago, Chicago, IL USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1931年 / 2卷 / 07期
关键词：
D O I：
10.1063/1.1748803
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：365 / 376
页数：12
相关论文
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