HIGH-FREQUENCY CAPACITIVE EFFECTS IN RESONANT-TUNNELING DIODES

被引:0
作者
LU, XJ
RHODES, D
PERLMAN, BS
机构
[1] U.S. Army Research Laboratory, Fort Monmouth
关键词
D O I
10.1063/1.355292
中图分类号
O59 [应用物理学];
学科分类号
摘要
The time-varying charge buildup in the quantum well region of a resonant tunneling diode (RTD) and related capacitive effects are calculated using the scattering matrix method developed. The small signal analysis of admittance shows a prominent influence from the capacitive effect, due to the dynamic shifting of the resonant energy levels. The model developed is helpful for understanding the RTD's high-frequency behavior and device applications.
引用
收藏
页码:2908 / 2913
页数:6
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