HIGH-RESOLUTION IMAGING BY 1 MV ELECTRON-MICROSCOPY

被引：17

作者：

HIRABAYASHI, M

HIRAGA, K

SHINDO, D

机构：

来源：

ULTRAMICROSCOPY | 1982年 / 9卷 / 03期

关键词：

D O I：

10.1016/0304-3991(82)90200-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：197 / 202

页数：6

共 26 条

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[2] BOURRET A, 1978, 9TH INT C EL MICR TO, V1, P294
[3] BOURRET A, 1980, ELECTRON MICROSCOPY, V1, P306
[4] FAULTED DIPOLES IN GERMANIUM A HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY
CHIANG, SW
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[J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1980, 42 (01): : 103 - 121
[5] COSSLETT VE, 1978, CHEM SCRIPTA, V14, P39
[6] THE SPACE GROUP OF BETA-SI3N4
GOODMAN, P
OKEEFFE, M
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1980, 36 (DEC): : 2891 - 2893
[7] HIGH-VOLTAGE, HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AU-CD ALLOYS .1. HEXAGONAL LONG-PERIOD SUPERSTRUCTURES NEAR 30 AT-PERCENT-CD
HIRABAYASHI, M
HIRAGA, K
SHINDO, D
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1981, 14 (JUN) : 169 - 177
[8] HIRABAYASHI M, 1980, ELECTRON MICROS, V4, P142
[9] DISLOCATIONS IN SILICON OBSERVED BY HIGH-VOLTAGE, HIGH-RESOLUTION ELECTRON-MICROSCOPY
HIRAGA, K
HIRABAYASHI, M
SATO, M
SUMINO, K
[J]. CRYSTAL RESEARCH AND TECHNOLOGY, 1982, 17 (02) : 189 - 195
[10] A STUDY OF THE ORDERED STRUCTURES OF THE AU-MN SYSTEM BY HIGH-VOLTAGE-HIGH-RESOLUTION ELECTRON-MICROSCOPY .1. 2-DIMENSIONAL ANTIPHASE STRUCTURE OF AU31MN9 BASED ON THE AU4MN STRUCTURE
HIRAGA, K
SHINDO, D
HIRABAYASHI, M
TERASAKI, O
WATANABE, D
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1980, 36 (NOV): : 2550 - 2554

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