TAPPING MODE ATOMIC-FORCE MICROSCOPY IN LIQUIDS

被引：696

作者：

HANSMA, PK ^{[1
]}

CLEVELAND, JP ^{[1
]}

RADMACHER, M ^{[1
]}

WALTERS, DA ^{[1
]}

HILLNER, PE ^{[1
]}

BEZANILLA, M ^{[1
]}

FRITZ, M ^{[1
]}

VIE, D ^{[1
]}

HANSMA, HG ^{[1
]}

PRATER, CB ^{[1
]}

MASSIE, J ^{[1
]}

FUKUNAGA, L ^{[1
]}

GURLEY, J ^{[1
]}

ELINGS, V ^{[1
]}

机构：

[1] DIGITAL INSTRUMENTS,SANTA BARBARA,CA 93103

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 13期

关键词：

D O I：

10.1063/1.111795

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Tapping mode atomic force microscopy in liquids gives a substantial improvement in imaging quality and stability over standard contact mode. In tapping mode the probe-sample separation is modulated as the probe scans over the sample. This modulation causes the probe to tap on the surface only at the extreme of each modulation cycle and therefore minimizes frictional forces that are present when the probe is constantly in contact with the surface. This imaging mode increases resolution and reduces sample damage on soft samples. For our initial experiments we used a tapping frequency of 17 kHz to image deoxyribonucleic acid plasmids on mica in water. When we imaged the same sample region with the same cantilever, the plasmids appeared 18 nm wide in

引用

页码：1738 / 1740

页数：3

共 24 条

[1] NEW SCANNING TUNNELING MICROSCOPY TIP FOR MEASURING SURFACE-TOPOGRAPHY [J].