DETERMINATION OF STRUCTURE POTENTIALS AND ABSORPTION POTENTIALS OF SILICON FROM ELECTRON DIFFRACTION INTENSITIES

被引：12
作者：
KREUTLE, M
MEYEREHM.G
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1971年 / 8卷 / 01期
关键词：
D O I：
10.1002/pssa.2210080110
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：111 / &
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