EFFECT OF ELECTRONIC STATES OF THE TIP ON THE STM IMAGE OF GRAPHITE

被引：34

作者：

ISSHIKI, N ^{[1
]}

KOBAYASHI, K ^{[1
]}

TSUKADA, M ^{[1
]}

机构：

[1] UNIV TOKYO,FAC SCI,DEPT PHYS,BUNKYO KU,TOKYO 113,JAPAN

来源：

SURFACE SCIENCE | 1990年 / 238卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(90)90051-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A first-principles calculation of the STM images of graphite is performed for three different shapes of a tungsten tip. In the calculation the tip is approximated by a small cluster. One of the tips, with more than one atom at the top, produces an abnormal image, while the others, with only one atom at the top, produce normal trigonal images. The abnormal image is caused by current interference through the multi peaks of the squared amplitude of the tunnel-active orbital at the tip. © 1990.

引用

页码：L439 / L445

页数：7

共 9 条

[1] TUNNELLING FROM A MANY-PARTICLE POINT OF VIEW [J].

BARDEEN, J .

PHYSICAL REVIEW LETTERS, 1961, 6 (02) :57-&

[2] EFFECT OF TIP ATOMIC-STRUCTURE ON SCANNING TUNNELING SPECTROSCOPY [J].

KOBAYASHI, K ;

ISSHIKI, N ;

TSUKADA, M .

SOLID STATE COMMUNICATIONS, 1990, 74 (11) :1187-1191

[3] EFFECT OF MICROSCOPIC TIP ELECTRONIC STATE ON STM IMAGE OF GRAPHITE [J].

KOBAYASHI, K ;

TSUKADA, M .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1989, 58 (07) :2238-2241

[4] SIMULATION OF SCANNING TUNNELING MICROSCOPE IMAGE BASED ON ELECTRONIC STATES OF SURFACE TIP SYSTEM [J].

KOBAYASHI, K ;

TSUKADA, M .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :170-173

[5] FERMI SURFACE IN TUNGSTEN [J].

MATTHEISS, LF .

PHYSICAL REVIEW, 1965, 139 (6A) :1893-+

[6] MULTIPLE-TIP INTERPRETATION OF ANOMALOUS SCANNING-TUNNELING-MICROSCOPY IMAGES OF LAYERED MATERIALS [J].

MIZES, HA ;

PARK, S ;

HARRISON, WA .

PHYSICAL REVIEW B, 1987, 36 (08) :4491-4494

[7] MOLECULAR-ORBITAL THEORY FOR THE SCANNING TUNNELING MICROSCOPY [J].

OHNISHI, S ;

TSUKADA, M .

SOLID STATE COMMUNICATIONS, 1989, 71 (05) :391-394

[8] THEORY OF THE SCANNING TUNNELING MICROSCOPE [J].

TERSOFF, J ;

HAMANN, DR .

PHYSICAL REVIEW B, 1985, 31 (02) :805-813

[9] THEORY OF ELECTRONIC PROCESSES OF SCANNING TUNNELING MICROSCOPY [J].

TSUKADA, M ;

SHIMA, N .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1987, 56 (08) :2875-2885

← 1 →