A LOW TEMPERATURE SINGLE CRYSTAL X-RAY DIFFRACTION TECHNIQUE

被引:41
|
作者
KAUFMAN, HS
FANKUCHEN, I
机构
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1949年 / 20卷 / 10期
关键词
D O I
10.1063/1.1741367
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:733 / 734
页数:2
相关论文
共 50 条
  • [21] High energy X-ray diffraction technique for monitoring solidification of single crystal castings
    Fitting, DW
    Dube, WP
    Siewert, TA
    NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS VIII, 1998, : 217 - 221
  • [22] A 31 T split-pair pulsed magnet for single crystal x-ray diffraction at low temperature
    Duc, F.
    Fabreges, X.
    Roth, T.
    Detlefs, C.
    Frings, P.
    Nardone, M.
    Billette, J.
    Lesourd, M.
    Zhang, L.
    Zitouni, A.
    Delescluse, P.
    Beard, J.
    Nicolin, J. P.
    Rikken, G. L. J. A.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (05):
  • [23] A low temperature X-ray single-crystal diffraction and polarised infra-red study of epidote
    Gatta, G. Diego
    Alvaro, Matteo
    Bromiley, Geoffrey
    PHYSICS AND CHEMISTRY OF MINERALS, 2012, 39 (01) : 1 - 15
  • [24] A low temperature X-ray single-crystal diffraction and polarised infra-red study of epidote
    G. Diego Gatta
    Matteo Alvaro
    Geoffrey Bromiley
    Physics and Chemistry of Minerals, 2012, 39 : 1 - 15
  • [25] Comparative crystal structure determination of griseofulvin: Powder X-ray diffraction versus single-crystal X-ray diffraction
    Pan QingQing
    Guo Ping
    Duan Jiong
    Cheng Qiang
    Li Hui
    CHINESE SCIENCE BULLETIN, 2012, 57 (30): : 3867 - 3871
  • [26] LOW-TEMPERATURE BAFFLE FOR SINGLE-CRYSTAL X-RAY-DIFFRACTION
    DERNIER, PD
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (06): : 931 - &
  • [27] In situ high temperature single crystal X-ray diffraction study of a natural omphacite
    Pavese, A
    Bocchio, R
    Ivaldi, G
    MINERALOGICAL MAGAZINE, 2000, 64 (06) : 983 - 993
  • [28] X-ray diffraction II: Using single-crystal X-ray diffraction to study polymorphism and solvatomorphism
    Brittain, HG
    SPECTROSCOPY, 2000, 15 (07) : 34 - 39
  • [29] HEMISPHERICAL FURNACE FOR HIGH-TEMPERATURE SINGLE CRYSTAL X-RAY DIFFRACTION STUDIES
    LYNCH, RW
    MOROSIN, B
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (OCT1) : 352 - &
  • [30] In situ high temperature powder x-ray diffraction technique using a sapphire single-crystal flat cell
    Kobayashi, S.
    Kawaguchi, S.
    Yamada, H.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2023, 94 (08):