X-RAY FLUORESCENT METHOD FOR ANALYSIS

[1] Afonin V. P., 1976, ZAVODSK LAB, V42, P670

[2] Afonin V. P., 1977, RENTGENOSPEKTRALNYI

[3] AFONIN VP, 1977, FUNDAMENTALNYE ISSLE, P137

[4] AFONIN VP, 1978, ZAVODSKAYA LAB, V44, P1086

[5] AFONIN VP, 1978, THESIS AN SSSR GEOKH

[6] AFONIN VP, 1974, ZAVODSKAYA LAB, V40, P655

[7] AFONIN VP, 1976, ZAVODSKAYA LAB, V42, P1075

[8] CORRECTIONS FOR MATRIX EFFECTS IN X-RAY FLUORESCENCE ANALYSIS USING MULTIPLE REGRESSION METHODS [J]. ANALYTICAL CHEMISTRY, 1965, 37 (13) : 1685 - &

[9] ALLEY BJ, 1968, NORELCO REP, V15, P87

[10] SEMITHEORETICAL APPROACH TO INTERELEMENT CORRECTION FACTORS IN SECONDARY X-RAY EMISSION ANALSIS [J]. ANALYTICAL CHEMISTRY, 1966, 38 (01) : 82 - +

[1] Afonin V. P., 1976, ZAVODSK LAB, V42, P670

[2] Afonin V. P., 1977, RENTGENOSPEKTRALNYI

[3] AFONIN VP, 1977, FUNDAMENTALNYE ISSLE, P137

[4] AFONIN VP, 1978, ZAVODSKAYA LAB, V44, P1086

[5] AFONIN VP, 1978, THESIS AN SSSR GEOKH

[6] AFONIN VP, 1974, ZAVODSKAYA LAB, V40, P655

[7] AFONIN VP, 1976, ZAVODSKAYA LAB, V42, P1075

[8] CORRECTIONS FOR MATRIX EFFECTS IN X-RAY FLUORESCENCE ANALYSIS USING MULTIPLE REGRESSION METHODS [J]. ANALYTICAL CHEMISTRY, 1965, 37 (13) : 1685 - &

[9] ALLEY BJ, 1968, NORELCO REP, V15, P87

[10] SEMITHEORETICAL APPROACH TO INTERELEMENT CORRECTION FACTORS IN SECONDARY X-RAY EMISSION ANALSIS [J]. ANALYTICAL CHEMISTRY, 1966, 38 (01) : 82 - +