ANALYSIS OF MATERIAL INHOMOGENEITIES IN SEMICONDUCTOR NUCLEAR PARTICLE DETECTORS USING CDTE

被引：9
作者：
ZANIO, K
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1970年 / 83卷 / 02期
关键词：
D O I：
10.1016/0029-554X(70)90473-8
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
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页码：288 / +
页数：1
相关论文
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