ACCURACY IN QUANTITATIVE ELECTRON-PROBE MICROANALYSIS

被引：1

|

作者：

HEINRICH, KFJ

机构：

来源：

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS | 1988年 / 93卷 / 03期

关键词：

D O I：

10.6028/jres.093.139

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：509 / 510

页数：2

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