ELECTRON MICRO-PROBE ANALYSIS OF THE DISTRIBUTION OF SILICON IN THE LEAVES OF SELAGINELLA-EMMELIANA

被引：14
作者：
DENGLER, NG [1 ]
LIN, EYC [1 ]
机构：
[1] ROYAL ONTARIO MUSEUM,ANALYT SYST LAB,TORONTO M5S 2C6,ONTARIO,CANADA
来源：
CANADIAN JOURNAL OF BOTANY-REVUE CANADIENNE DE BOTANIQUE | 1980年 / 58卷 / 23期
关键词：
D O I：
10.1139/b80-286
中图分类号：
Q94 [植物学];
学科分类号：
071001 ;
摘要：
引用
收藏
页码：2459 / 2466
页数：8
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