AMORPHOUS-SEMICONDUCTOR ELECTROLYTE JUNCTION - INFLUENCE OF THE WAVELENGTH AND OXIDE THICKNESS ON THE PHOTOCHARACTERISTICS OF A-NB2O5 ANODIC FILMS

被引：33

作者：

DIQUARTO, F

PIAZZA, S

DAGOSTINO, R

SUNSERI, C

机构：

[1] Univ di Palermo, Palermo, Italy, Univ di Palermo, Palermo, Italy

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1987年 / 228卷 / 1-2期

关键词：

D O I：

10.1016/0022-0728(87)80102-X

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

SEMICONDUCTOR MATERIALS

引用

页码：119 / 134

页数：16

共 27 条

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[8] PHOTO-ELECTROCHEMICAL STUDY OF THE AMORPHOUS-WO3-SEMICONDUCTOR ELECTROLYTE JUNCTION [J].

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DIPAOLA, A .

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[9]

DIQUARTO F, 1986, C STRUCTURE DYNAMICS

[10]

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