POWER TRANSISTOR CRYSTAL DAMAGE IN INDUCTIVE LOAD SWITCHING

被引:8
作者
GAUR, SP [1 ]
LOWE, G [1 ]
机构
[1] IBM CORP,DIV SYST PROD,E FISHKILL FACILITY,HOPEWELL JUNCTION,NY 12533
关键词
D O I
10.1016/0038-1101(77)90216-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1026 / 1027
页数:2
相关论文
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