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TRANSIENT ANNEALING OF ARSENIC-IMPLANTED SILICON USING A GRAPHITE STRIP HEATER
被引:30
作者
:
TSAUR, BY
论文数:
0
引用数:
0
h-index:
0
TSAUR, BY
DONNELLY, JP
论文数:
0
引用数:
0
h-index:
0
DONNELLY, JP
FAN, JCC
论文数:
0
引用数:
0
h-index:
0
FAN, JCC
GEIS, MW
论文数:
0
引用数:
0
h-index:
0
GEIS, MW
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1981年
/ 39卷
/ 01期
关键词
:
D O I
:
10.1063/1.92529
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:93 / 95
页数:3
相关论文
共 13 条
[1]
ELECTRICAL BEHAVIOR OF GROUP-3 AND GROUP-V IMPLANTED DOPANTS IN SILICON
[J].
BARON, R
论文数:
0
引用数:
0
h-index:
0
机构:
Hughes Research Laboratories, Malibu
BARON, R
;
SHIFRIN, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Hughes Research Laboratories, Malibu
SHIFRIN, GA
;
MARSH, OJ
论文数:
0
引用数:
0
h-index:
0
机构:
Hughes Research Laboratories, Malibu
MARSH, OJ
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
Hughes Research Laboratories, Malibu
MAYER, JW
.
JOURNAL OF APPLIED PHYSICS,
1969,
40
(09)
:3702
-&
[2]
ANNEALING OF ION-IMPLANTED SILICON BY AN INCOHERENT-LIGHT PULSE
[J].
BOMKE, HA
论文数:
0
引用数:
0
h-index:
0
BOMKE, HA
;
BERKOWITZ, HL
论文数:
0
引用数:
0
h-index:
0
BERKOWITZ, HL
;
HARMATZ, M
论文数:
0
引用数:
0
h-index:
0
HARMATZ, M
;
KRONENBERG, S
论文数:
0
引用数:
0
h-index:
0
KRONENBERG, S
;
LUX, R
论文数:
0
引用数:
0
h-index:
0
LUX, R
.
APPLIED PHYSICS LETTERS,
1978,
33
(11)
:955
-957
[3]
INCOHERENT-LIGHT-FLASH ANNEALING OF PHOSPHORUS-IMPLANTED SILICON
[J].
CORRERA, L
论文数:
0
引用数:
0
h-index:
0
CORRERA, L
;
PEDULLI, L
论文数:
0
引用数:
0
h-index:
0
PEDULLI, L
.
APPLIED PHYSICS LETTERS,
1980,
37
(01)
:55
-57
[4]
DISORDER PRODUCED BY HIGH-DOSE IMPLANTATION IN SI
[J].
CSEPREGI, L
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
CSEPREGI, L
;
KENNEDY, EF
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
KENNEDY, EF
;
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
LAU, SS
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
MAYER, JW
;
SIGMON, TW
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
SIGMON, TW
.
APPLIED PHYSICS LETTERS,
1976,
29
(10)
:645
-648
[5]
DIFFUSION OF ION-IMPLANTED ARSENIC IN SILICON
[J].
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, READING, PA 19603 USA
BELL TEL LABS INC, READING, PA 19603 USA
FAIR, RB
;
TSAI, JCC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, READING, PA 19603 USA
BELL TEL LABS INC, READING, PA 19603 USA
TSAI, JCC
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(12)
:1689
-1696
[6]
FERRIS SD, 1978, AIP C P, V50
[7]
GIBBONS JF, 1975, PROJECTED RANGE STAT
[8]
DIRECT OBSERVATIONS OF DEFECTS IN IMPLANTED AND POST-ANNEALED SILICON WAFERS
[J].
GLOWINSKI, LD
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
GLOWINSKI, LD
;
TU, KN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TU, KN
;
HO, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HO, PS
.
APPLIED PHYSICS LETTERS,
1976,
28
(06)
:312
-313
[9]
SOLAR FURNACE ANNEALING OF AMORPHOUS SI LAYERS
[J].
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
LAU, SS
;
ALLMEN, MV
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
ALLMEN, MV
;
GOLECKI, I
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
GOLECKI, I
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
NICOLET, MA
;
KENNEDY, EF
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
KENNEDY, EF
;
TSENG, WF
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
TSENG, WF
.
APPLIED PHYSICS LETTERS,
1979,
35
(04)
:327
-329
[10]
THE SOLID SOLUBILITY AND THERMAL-BEHAVIOR OF METASTABLE CONCENTRATIONS OF AS IN SI
[J].
LIETOILA, A
论文数:
0
引用数:
0
h-index:
0
LIETOILA, A
;
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
GIBBONS, JF
;
SIGMON, TW
论文数:
0
引用数:
0
h-index:
0
SIGMON, TW
.
APPLIED PHYSICS LETTERS,
1980,
36
(09)
:765
-768
←
1
2
→
共 13 条
[1]
ELECTRICAL BEHAVIOR OF GROUP-3 AND GROUP-V IMPLANTED DOPANTS IN SILICON
[J].
BARON, R
论文数:
0
引用数:
0
h-index:
0
机构:
Hughes Research Laboratories, Malibu
BARON, R
;
SHIFRIN, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Hughes Research Laboratories, Malibu
SHIFRIN, GA
;
MARSH, OJ
论文数:
0
引用数:
0
h-index:
0
机构:
Hughes Research Laboratories, Malibu
MARSH, OJ
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
Hughes Research Laboratories, Malibu
MAYER, JW
.
JOURNAL OF APPLIED PHYSICS,
1969,
40
(09)
:3702
-&
[2]
ANNEALING OF ION-IMPLANTED SILICON BY AN INCOHERENT-LIGHT PULSE
[J].
BOMKE, HA
论文数:
0
引用数:
0
h-index:
0
BOMKE, HA
;
BERKOWITZ, HL
论文数:
0
引用数:
0
h-index:
0
BERKOWITZ, HL
;
HARMATZ, M
论文数:
0
引用数:
0
h-index:
0
HARMATZ, M
;
KRONENBERG, S
论文数:
0
引用数:
0
h-index:
0
KRONENBERG, S
;
LUX, R
论文数:
0
引用数:
0
h-index:
0
LUX, R
.
APPLIED PHYSICS LETTERS,
1978,
33
(11)
:955
-957
[3]
INCOHERENT-LIGHT-FLASH ANNEALING OF PHOSPHORUS-IMPLANTED SILICON
[J].
CORRERA, L
论文数:
0
引用数:
0
h-index:
0
CORRERA, L
;
PEDULLI, L
论文数:
0
引用数:
0
h-index:
0
PEDULLI, L
.
APPLIED PHYSICS LETTERS,
1980,
37
(01)
:55
-57
[4]
DISORDER PRODUCED BY HIGH-DOSE IMPLANTATION IN SI
[J].
CSEPREGI, L
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
CSEPREGI, L
;
KENNEDY, EF
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
KENNEDY, EF
;
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
LAU, SS
;
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
MAYER, JW
;
SIGMON, TW
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD LABS,PALO ALTO,CA 94304
SIGMON, TW
.
APPLIED PHYSICS LETTERS,
1976,
29
(10)
:645
-648
[5]
DIFFUSION OF ION-IMPLANTED ARSENIC IN SILICON
[J].
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, READING, PA 19603 USA
BELL TEL LABS INC, READING, PA 19603 USA
FAIR, RB
;
TSAI, JCC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, READING, PA 19603 USA
BELL TEL LABS INC, READING, PA 19603 USA
TSAI, JCC
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(12)
:1689
-1696
[6]
FERRIS SD, 1978, AIP C P, V50
[7]
GIBBONS JF, 1975, PROJECTED RANGE STAT
[8]
DIRECT OBSERVATIONS OF DEFECTS IN IMPLANTED AND POST-ANNEALED SILICON WAFERS
[J].
GLOWINSKI, LD
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
GLOWINSKI, LD
;
TU, KN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TU, KN
;
HO, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HO, PS
.
APPLIED PHYSICS LETTERS,
1976,
28
(06)
:312
-313
[9]
SOLAR FURNACE ANNEALING OF AMORPHOUS SI LAYERS
[J].
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
LAU, SS
;
ALLMEN, MV
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
ALLMEN, MV
;
GOLECKI, I
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
GOLECKI, I
;
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
NICOLET, MA
;
KENNEDY, EF
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
KENNEDY, EF
;
TSENG, WF
论文数:
0
引用数:
0
h-index:
0
机构:
California Institute of Technology, Pasadena
TSENG, WF
.
APPLIED PHYSICS LETTERS,
1979,
35
(04)
:327
-329
[10]
THE SOLID SOLUBILITY AND THERMAL-BEHAVIOR OF METASTABLE CONCENTRATIONS OF AS IN SI
[J].
LIETOILA, A
论文数:
0
引用数:
0
h-index:
0
LIETOILA, A
;
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
GIBBONS, JF
;
SIGMON, TW
论文数:
0
引用数:
0
h-index:
0
SIGMON, TW
.
APPLIED PHYSICS LETTERS,
1980,
36
(09)
:765
-768
←
1
2
→