PROPERTIES OF AMMONIA-FREE NITROGEN-SI3N4 FILMS PRODUCED AT LOW-TEMPERATURES

被引:55
作者
GERETH, R
SCHERBER, W
机构
关键词
D O I
10.1149/1.2404452
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1248 / &
相关论文
共 14 条
[1]   SOME PROPERTIES OF VAPOR DEPOSITED SILICON NITRIDE FILMS USING SIH4-NH3-H2 SYSTEM [J].
BEAN, KE ;
GLEIM, PS ;
YEAKLEY, RL ;
RUNYAN, WR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (07) :733-&
[2]   ELECTRICAL CHARACTERISTICS OF SILICON NITRIDE FILMS PREPARED BY SILANE-AMMONIA REACTION [J].
BROWN, GA ;
ROBINETT.WC ;
CARLSON, HG .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (09) :948-&
[3]   PREPARATION AND PROPERTIES OF AMORPHOUS SILICON NITRIDE FILMS [J].
CHU, TL ;
LEE, CH ;
GRUBER, GA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (07) :717-&
[4]   PREPARATION AND PROPERTIES OF PYROLYTIC SILICON NITRIDE [J].
DOO, VY ;
NICHOLS, DR ;
SILVEY, GA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (12) :1279-&
[5]   CHARGE TRANSPORT AND STORAGE IN METAL-NITRIDE-OXIDE-SILICON (MNOS) STRUCTURES [J].
FROHMANB.D ;
LENZLINGER, M .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) :3307-+
[6]  
GERETH R, 1970, 144 LOS ANG M SOC PA
[7]   SILICON NITRIDE FILMS BY REACTIVE SPUTTERING [J].
HU, SM ;
GREGOR, LV .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (08) :826-+
[10]   ANALYSIS OF SILICON NITRIDE LAYERS DEPOSITED FROM SIH4 AND N2 ON SILICON [J].
MEYER, O ;
SCHERBER, W .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1971, 32 (08) :1909-&