X-RAY FILTERING TO IMPROVE SIGNAL-TO-NOISE IN SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY

被引:8
作者
BAUN, WL
CHAMBERLAIN, MB
SOLOMON, JS
机构
[1] USAF, MAT LAB, WRIGHT PATTERSON AFB, OH 45433 USA
[2] UNIV DAYTON, RES INST, DAYTON, OH 45469 USA
关键词
D O I
10.1063/1.1686408
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1419 / 1420
页数:2
相关论文
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BAUN, WL ;
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REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (09) :1421-1422
[2]  
CHAMBERLAIN MB, TO BE PUBLISHED
[3]  
HENKE BL, 1967, AFOSR671254
[4]   SOFT X-RAY APPEARANCE POTENTIAL SPECTROMETER FOR ANALYSIS OF SOLID SURFACES [J].
PARK, RL ;
HOUSTON, JE ;
SCHREINER, DG .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (12) :1810-+