OPTICAL AND ELECTRICAL CHARACTERIZATION OF CHEMICAL DEFECTS IN GAAS-LAYERS GROWN BY MBE

被引:14
作者
KOSCHEL, WH
SMITH, RS
HIESINGER, P
机构
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D O I
10.1149/1.2127631
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:1336 / 1339
页数:4
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