STATIC ANALYSIS OF MICROSTRIP DISCONTINUITIES USING THE EXCESS CHARGE-DENSITY IN THE SPECTRAL DOMAIN

被引：18
作者：
MARTEL, J
BOIX, RR
HORNO, M
机构：
[1] Department of Electronics and Electromagnetism, University of Seville., Avd. Reina Mercedes s/n
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1991年 / 39卷 / 09期
关键词：
D O I：
10.1109/22.83839
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Galerkin's method in the spectral domain is applied to solve for the excess charge density existing on the strips of open-end and symmetric gap discontinuities in multilayered anisotropic substrates. The excess charge density is used to determine the capacitance components of the equivalent circuits of these discontinuities. Numerical results are provided and a comparison with previous results existing in the literature is carried out.
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收藏
页码：1623 / 1631
页数：9
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